Dielectric breakdown of a Mott insulator

Martin Eckstein

ETH Zürich, Institut für Theoretische Physik, Zürich, Switzerland

A strong electrical field can induce a current-carrying (metallic) state in a Mott insulator. This phenomenon is the many-body analog of the well-known Landau-Zener breakdown of band insulators. We investigate the problem by means of nonequilibrium dynamical mean-field theory (DMFT), using a recently developed impurity solver that is based on a systematic perturbation expansion in the hybridization [1]. The field-induced current is found to increase with a threshold behavior exp(E/Eth), where the threshold field Eth vanishes at the metal-insulator transition [2]. Furthermore, the DMFT calculation reveals a field-enhanced decay of the thermal (linear response) current in the system if the system is not coupled to an external environment, which may be important to understand the field-induced current switching that is observed in several Mott insulating materials.

[1] M. Eckstein, and P. Werner, Phys. Rev. B 82, 115115 (2010).
[2] M. Eckstein, T. Oka, and P. Werner, Phys. Rev. Lett. 105, 146404 (2010).

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