Energy dissipation in single-bond formation and vertical atom manipulation
measured with an atomic force microscope

Oscar Custance

National Institute for Materials Science, Advanced Nano Characterization Center, Tsukuba, Japan

The atomic force microscope (AFM) is a fascinating tool that enables us to explore the forces and phenomenology associated with the formation of a single bond between the foremost front atom of a sharp probe and individual atoms at surfaces [1,2]. This phenomenology includes the dissipation of energy from the cantilever oscillation; an observable that produces images with atomic-scale contrast [3], and it is closely related to friction and adhesion. In this contribution, we will present a combination of force spectroscopic measurements and first-principles calculations that has contributed in a decisive way to further clarify the enhancement of atomic contrast in the signal associated with the energy dissipated from the cantilever oscillation [4]. We will also discuss implications of these results regarding signatures of energy dissipation in the behavior of AFM observables that, a priori, should only reflect the conservative part of the tip-surface interaction [5,6], and that have been recently identified in vertical atomic manipulation experiments [7].

References:
[1] M. A. Lantz, et al., Science 291, 2580 (2001)
[2] Y. Sugimoto, et al., Nature 445, 64 (2007)
[3] R. Bennewitz, et al., Phys. Rev. B 62, 2074 (2000)
[4] N. Oyabu, et al., Phys. Rev. Lett. 96, 106101 (2006)
[5] A. Schirmeisen et al., Phys. Rev. Lett. 97, 136101 (2006)
[6] H. Hölscher, et al., Phys. Rev. B 64, 075402 (2001)
[7] Y. Sugimoto, et al., Science 322, 413 (2008)

Back